OpenLegislation

Division 3

United Kingdom

Original text. Later amendments are not shown.

For the purposes of subheadings 9030 81 81 and 9030 89 81, the expression ‘semiconductor production test apparatus’ means electronic apparatus for functionality testing of digital integrated circuits (in the manufacturing process), providing programmable timing, data format of signals and test rate, without interruption to the test cycle, comprising an interface test head for connection to the devices under test, a signal control unit, digital signal generators, digital measure and compare units and associated power supplies.

Notes on Chapter 90

Footnotes

f1

Entry under this subheading is subject to conditions laid down in the relevant Community provisions. See also Section II, paragraph B, of the preliminary provisions.

f2

Entry under this subheading is subject to conditions laid down in the relevant Community provisions.