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Paragraph 6B Equipment, Assemblies and Components

Changes not yet applied. Later legislation changes this provision in ways not yet written into the text below:

Test, Inspection and Production Equipment

6B004
a.

Equipment for measuring absolute reflectance to an accuracy of ± 0.1% of the reflectance value;

b.

Equipment other than optical surface scattering measurement equipment, having an unobscured aperture of more than 10 cm, specially designed for the non-contact optical measurement of a non-planar optical surface figure (profile) to an accuracy of 2 nm or less (better) against the required profile.

  • Note: This entry does not specify microscopes.

6B005

Specially designed or modified equipment, including tools, dies, fixtures or gauges, as follows, and other specially designed components and accessories therefor:

a.

For the manufacture or inspection of:

1.

Free electron laser magnet wigglers;

2.

Free electron laser photo injectors;

b.

For the adjustment, to required tolerances, of the longitudinal magnetic field of free electron lasers.

6B007

Equipment to produce, align and calibrate land-based gravity meters with a static accuracy of better than 0.1 milligal.

6B008

Pulse radar cross-section measurement systems having transmit pulse widths of 100 ns or less and specially designed components therefor.

6B108

Systems specially designed for radar cross section measurement usable for missiles and their subsystems.