Paragraph 6B Equipment, Assemblies and Components
Test, Inspection and Production Equipment
Equipment for measuring absolute reflectance to an accuracy of ± 0.1% of the reflectance value;
Equipment other than optical surface scattering measurement equipment, having an unobscured aperture of more than 10 cm, specially designed for the non-contact optical measurement of a non-planar optical surface figure (profile) to an accuracy of 2 nm or less (better) against the required profile.
-
Note: This entry does not specify microscopes.
Specially designed or modified equipment, including tools, dies, fixtures or gauges, as follows, and other specially designed components and accessories therefor:
For the manufacture or inspection of:
Free electron laser magnet wigglers;
Free electron laser photo injectors;
For the adjustment, to required tolerances, of the longitudinal magnetic field of free electron lasers.
Equipment to produce, align and calibrate land-based gravity meters with a static accuracy of better than 0.1 milligal.
Pulse radar cross-section measurement systems having transmit pulse widths of 100 ns or less and specially designed components therefor.
Systems specially designed for radar cross section measurement usable for missiles and their subsystems.