OpenLegislation

Division [3B002] Test equipment specially designed for testing finished or unfinished semiconductor devices as follows and specially designed components and accessories therefor:F1

Changes not yet applied. Later legislation changes this provision in ways not yet written into the text below:

  1. a..

    For testing S-parameters of items specified in 3A001.b.3.;

  2. b..

    Not used;

  3. c..

    For testing items specified in 3A001.b.2.

Annotations

Textual amendments

F1

Substituted by Commission Delegated Regulation (EU) 2020/1749 of 7 October 2020 amending Council Regulation (EC) No 428/2009 setting up a Community regime for the control of exports, transfer, brokering and transit of dual-use items.