Division [3B] Test, Inspection and Production EquipmentF1

United Kingdom

1. [3B001]Equipment for the manufacturing of semiconductor devices or materials, as follows and specially designed components and accessories therefor:
2. [3B002]Test equipment specially designed for testing finished or unfinished semiconductor devices as follows and specially designed components and accessories therefor:
3. [3B501]Equipment for the manufacturing of semiconductor devices or materials, as follows and specially designed components and accessories therefor:
4. [3B503]Scanning Electron Microscope (SEM) equipment designed for imaging semiconductor devices or integrated circuits, having all of the following:
5. [3B504]Cryogenic wafer probing equipment having all of the following: