OpenLegislation

Division [3B504] Cryogenic wafer probing equipment having all of the following:F1

Changes not yet applied. Later legislation changes this provision in ways not yet written into the text below:

a.Designed to test devices at temperatures less than or equal to 4,5 K (-268,65°C); and
b.Designed to accommodate wafer diameters greater than or equal to 100 mm.

Annotations

Textual amendments

F1

Annex 1 Entries 3B501, 3B503, 3B504 inserted (16.12.2025) by The Export Control (Amendment) (No. 2) Regulations 2025 (S.I. 2025/1197), regs. 1(2), 9(3)(d)

Notes on Annex I

Textual amendments

F1

Substituted by Commission Delegated Regulation (EU) 2020/1749 of 7 October 2020 amending Council Regulation (EC) No 428/2009 setting up a Community regime for the control of exports, transfer, brokering and transit of dual-use items.

Notes on Division

Textual amendments

F1

Substituted by Commission Delegated Regulation (EU) 2020/1749 of 7 October 2020 amending Council Regulation (EC) No 428/2009 setting up a Community regime for the control of exports, transfer, brokering and transit of dual-use items.

Notes on Division [3B]

Textual amendments

F1

Substituted by Commission Delegated Regulation (EU) 2020/1749 of 7 October 2020 amending Council Regulation (EC) No 428/2009 setting up a Community regime for the control of exports, transfer, brokering and transit of dual-use items.