Paragraph 8 Quantum computing and advanced materials goodsF1

Microscopes, related equipment and detectors, as follows—

(a)

scanning electron microscopes (SEM);

(b)

scanning auger microscopes;

(c)

transmission electron microscopes (TEM);

(d)

atomic force microscopes (AFM);

(e)

scanning force microscopes (SFM);

(f)

equipment and detectors specially designed for use with the microscopes specified in sub-paragraphs (a) to (e), employing any of the following—

(i)

X-ray photo spectroscopy (XPS);

(ii)

energy-dispersive X-ray spectroscopy (EDX, EDS);

(iii)

electron back scatter detector (EBSD) systems;

(iv)

electron spectroscopy for chemical analysis (ESCA).

Annotations

F1: Sch. 2G inserted (5.7.2022) by The Republic of Belarus (Sanctions) (EU Exit) (Amendment) Regulations 2022 (S.I. 2022/748), reg. 1(2), Sch.