Paragraph 8 Quantum computing and advanced materials goodsF1

Microscopes, related equipment and detectors, as follows—

(a)

scanning electron microscopes (SEM);

(b)

scanning auger microscopes;

(c)

transmission electron microscopes (TEM);

(d)

atomic force microscopes (AFM);

(e)

scanning force microscopes (SFM);

(f)

equipment and detectors specially designed for use with the microscopes specified in sub-paragraphs (a) to (e), employing any of the following—

(i)

X-ray photo spectroscopy (XPS);

(ii)

energy-dispersive X-ray spectroscopy (EDX, EDS);

(iii)

electron back scatter detector (EBSD) systems;

(iv)

electron spectroscopy for chemical analysis (ESCA).

Annotations

F1: Sch. 2E inserted (14.4.2022 at 5.00 p.m.) by The Russia (Sanctions) (EU Exit) (Amendment) (No. 8) Regulations 2022 (S.I. 2022/452), reg. 1(2), Sch. Pt. 1

F1: Regulations extended (British overseas territories) (with modifications) (31.12.2020 immediately after both S.I. 2020/590 and S.I. 2020/951 have come into force) by The Russia (Sanctions) (Overseas Territories) Order 2020 (S.I. 2020/1571), arts. 1(1), 2, Schs. 1, 2 (as amended: (11.3.2021) by S.I. 2021/288, arts. 1(1), 2(2); (14.4.2022) by S.I. 2022/453, arts. 1(1), 3-38; (20.7.2022) by S.I. 2022/843, arts. 1(1), 3; (10.11.2022) by S.I. 2022/1167, arts. 1(1), 3-17; (15.12.2022) by S.I. 2022/1338, arts. 1(1), 3-10; (9.3.2023) by S.I. 2023/291, arts. 1(1), 3-9; (20.7.2023) by S.I. 2023/846, arts. 1(1), 3, 5-22; (30.9.2023) by S.I. 2023/846, arts. 1(2), 4; (14.3.2024) by S.I. 2024/370, arts. 1, 3-13; (3.10.2024) by S.I. 2024/987, arts. 1(1), 3-6; and (11.12.2025) by S.I. 2025/1307, art. 1(1), Sch. 15)